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Characterization Of A High Frequency Probe Assembly For Integrated Circuit Measurement

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Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement
Language: en
Pages: 64

Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement

Authors: Ramon L. Jesch
Categories: Integrated circuits
Type: BOOK - Published: 1975 - Publisher:

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A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements
NBS Technical Note
Language: en
Pages: 68

NBS Technical Note

Authors:
Categories: Physical instruments
Type: BOOK - Published: 1975-04 - Publisher:

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Journal of Research of the National Bureau of Standards
Language: en
Pages: 554

Journal of Research of the National Bureau of Standards

Authors: United States. National Bureau of Standards
Categories: Chemistry
Type: BOOK - Published: 1975 - Publisher:

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ERDA Research Abstracts
Language: en
Pages: 780

ERDA Research Abstracts

Authors: United States. Energy Research and Development Administration
Categories: Power resources
Type: BOOK - Published: 1976 - Publisher:

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ERDA Energy Research Abstracts
Language: en
Pages: 756

ERDA Energy Research Abstracts

Authors: United States. Energy Research and Development Administration
Categories: Medicine
Type: BOOK - Published: 1976 - Publisher:

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