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Conductive Atomic Force Microscopy
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Authors: Mario Lanza
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Type: BOOK - Published: 2017-12-04 - Publisher: John Wiley & Sons

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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscal
Electrical Atomic Force Microscopy for Nanoelectronics
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Authors: Umberto Celano
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated
Conductive Atomic Force Microscopy
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Authors: Mario Lanza
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Type: BOOK - Published: 2017-08-03 - Publisher: John Wiley & Sons

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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscal
Atomic Force Microscopy
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Organic Electronics II
Language: en
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Authors: Hagen Klauk
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Like its predecessor this book is devoted to the materials, manufacturing and applications aspects of organic thin-film transistors. Once again authored by the