Logic Testing and Design for Testability
| Author | : Hideo Fujiwara |
| Publisher | : MIT Press |
| Total Pages | : 314 |
| Release | : 1985 |
| ISBN-10 | : UCAL:B4164031 |
| ISBN-13 | : |
| Rating | : 4/5 (31 Downloads) |
Book Synopsis Logic Testing and Design for Testability by : Hideo Fujiwara
Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press. This book was released on 1985 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.