Related Books

Long-Term Reliability of Nanometer VLSI Systems
Language: en
Pages: 460
Authors: Sheldon Tan
Categories: Technology & Engineering
Type: BOOK - Published: 2019-09-12 - Publisher: Springer Nature

DOWNLOAD EBOOK

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems
Research in VLSI Reliability
Language: en
Pages: 4
Authors: Chenming Hu
Categories:
Type: BOOK - Published: 1986 - Publisher:

DOWNLOAD EBOOK

In order to increase the circuit density and speed of VLSI systems, microelectronic device geometry is shrinking from a few microns to submicron and beyond. Thi
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Language: en
Pages: 326
Authors: Ruijing Shen
Categories: Technology & Engineering
Type: BOOK - Published: 2014-07-08 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and effici
Hot-Carrier Reliability of MOS VLSI Circuits
Language: en
Pages: 223
Authors: Yusuf Leblebici
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a
Circuit Design for Reliability
Language: en
Pages: 271
Authors: Ricardo Reis
Categories: Technology & Engineering
Type: BOOK - Published: 2014-11-08 - Publisher: Springer

DOWNLOAD EBOOK

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enha