Microscopy Of Semiconducting Materials
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Language: en
Pages: 504
Pages: 504
Type: BOOK - Published: 2008-12-02 - Publisher: Springer Science & Business Media
This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambri
Language: en
Pages: 820
Pages: 820
Type: BOOK - Published: 1987-10-01 - Publisher: CRC Press
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin m
Language: en
Pages: 540
Pages: 540
Type: BOOK - Published: 2009-09-02 - Publisher: Springer
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by th
Language: en
Pages: 467
Pages: 467
Type: BOOK - Published: 2013-10-22 - Publisher: Academic Press
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology.
Language: en
Pages: 656
Pages: 656
Type: BOOK - Published: 2002-12-04 - Publisher: CRC Press
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principle