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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
VLSI Fault Modeling and Testing Techniques
Language: en
Pages: 216
Authors: George W. Zobrist
Categories: Computers
Type: BOOK - Published: 1993 - Publisher: Praeger

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VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t
VLSI Test Principles and Architectures
Language: en
Pages: 809
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201
Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
VLSI Design and Test for Systems Dependability
Language: en
Pages: 792
Authors: Shojiro Asai
Categories: Technology & Engineering
Type: BOOK - Published: 2018-07-20 - Publisher: Springer

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This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design a