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Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Language: en
Pages: 281
Authors: David J Dumin
Categories: Technology & Engineering
Type: BOOK - Published: 2002-01-18 - Publisher: World Scientific

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This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in
Dielectric Breakdown in Gigascale Electronics
Language: en
Pages: 109
Authors: Juan Pablo Borja
Categories: Technology & Engineering
Type: BOOK - Published: 2016-09-16 - Publisher: Springer

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This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Covera
Reliability Physics and Engineering
Language: en
Pages: 469
Authors: J. W. McPherson
Categories: Technology & Engineering
Type: BOOK - Published: 2018-12-20 - Publisher: Springer

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This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engi
Oxide Reliability
Language: en
Pages: 292
Authors: D. J. Dumin
Categories: Technology & Engineering
Type: BOOK - Published: 2002 - Publisher: World Scientific

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Presents in summary the state of our knowledge of oxide reliability.
Lateral Power Transistors in Integrated Circuits
Language: en
Pages: 235
Authors: Tobias Erlbacher
Categories: Technology & Engineering
Type: BOOK - Published: 2014-10-08 - Publisher: Springer

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The book summarizes and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power elec