Register-transfer Level Fault Modeling and Test Evaluation Technique for VLSI Circuits
Author | : Pradipkumar Arunbhai Thaker |
Publisher | : |
Total Pages | : 182 |
Release | : 2000 |
ISBN-10 | : OCLC:44940062 |
ISBN-13 | : |
Rating | : 4/5 (62 Downloads) |
Download or read book Register-transfer Level Fault Modeling and Test Evaluation Technique for VLSI Circuits written by Pradipkumar Arunbhai Thaker and published by . This book was released on 2000 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: