Download or read book Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices written by Takashi Nakamura and published by World Scientific. This book was released on 2008 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.