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VLSI Design and Test for Systems Dependability
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Authors: Shojiro Asai
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Type: BOOK - Published: 2018-07-20 - Publisher: Springer

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This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design a
VLSI Test Principles and Architectures
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Authors: Laung-Terng Wang
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Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
VLSI Design and Test
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Authors: Anirban Sengupta
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Type: BOOK - Published: 2019-08-17 - Publisher: Springer

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This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The
VLSI Design and Test
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Authors: Brajesh Kumar Kaushik
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017
VLSI Fault Modeling and Testing Techniques
Language: en
Pages: 216
Authors: George W. Zobrist
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Type: BOOK - Published: 1993 - Publisher: Praeger

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VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t