Vlsi Design And Test
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Language: en
Pages: 792
Pages: 792
Type: BOOK - Published: 2018-07-20 - Publisher: Springer
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design a
Language: en
Pages: 809
Pages: 809
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
Language: en
Pages: 782
Pages: 782
Type: BOOK - Published: 2019-08-17 - Publisher: Springer
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The
Language: en
Pages: 820
Pages: 820
Type: BOOK - Published: 2017-12-21 - Publisher: Springer
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017
Language: en
Pages: 216
Pages: 216
Type: BOOK - Published: 1993 - Publisher: Praeger
VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in t