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Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI
Author :
Publisher : Springer Science & Business Media
Total Pages : 281
Release :
ISBN-10 : 9783540850373
ISBN-13 : 3540850376
Rating : 4/5 (73 Downloads)
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Book Synopsis Applied Scanning Probe Methods XI by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.


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Applied Scanning Probe Methods XI
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Applied Scanning Probe Methods XI

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Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-22 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a
Applied Scanning Probe Methods VII
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The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a
Applied Scanning Probe Methods XII
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Pages: 271

Applied Scanning Probe Methods XII

Authors: Bharat Bhushan
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Type: BOOK - Published: 2008-10-24 - Publisher: Springer Science & Business Media

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Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es-
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The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe technique
Applied Scanning Probe Methods XIII
Language: en
Pages: 284

Applied Scanning Probe Methods XIII

Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-29 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out i