Characteristics Simulation Device Modeling And Reliability Test Of Insulated Gate Bipolar Transistor

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Characteristics Simulation, Device Modeling and Reliability Test of Insulated Gate Bipolar Transistor

Author	: 許哲誌
Publisher	:
Total Pages	:
Release	: 2010
ISBN-10	: OCLC:874562352
ISBN-13	:
Rating	: 4/5 (52 Downloads)

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Book Synopsis Characteristics Simulation, Device Modeling and Reliability Test of Insulated Gate Bipolar Transistor by : 許哲誌

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