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Design for AT-Speed Test, Diagnosis and Measurement
Language: en
Pages: 251
Authors: Benoit Nadeau-Dostie
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system de
A Designer’s Guide to Built-In Self-Test
Language: en
Pages: 338
Authors: Charles E. Stroud
Categories: Technology & Engineering
Type: BOOK - Published: 2005-12-27 - Publisher: Springer Science & Business Media

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
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Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Introduction to Advanced System-on-Chip Test Design and Optimization
Language: en
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Authors: Erik Larsson
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing,
Elements of STIL
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Authors: Gregory A. Maston
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Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Standard • Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and accepte