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Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically sum
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Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic textu
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T