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IDDQ Testing of VLSI Circuits
Language: en
Pages: 134
Authors: Ravi K. Gulati
Categories: Computers
Type: BOOK - Published: 1992-12-31 - Publisher: Springer Science & Business Media

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Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in th
Introduction to IDDQ Testing
Language: en
Pages: 336
Authors: S. Chakravarty
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of inp
IDDQ Testing of VLSI Circuits
Language: en
Pages: 121
Authors: Ravi K. Gulati
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in th
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Iddq Testing for CMOS VLSI
Language: en
Pages: 216
Authors: Rochit Rajsuman
Categories: Technology & Engineering
Type: BOOK - Published: 1995 - Publisher: Artech House Publishers

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This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides