Related Books

Real-Time Characterization of Hot-Wire CVD Growth of Si
Language: en
Pages: 4
Authors:
Categories:
Type: BOOK - Published: 2001 - Publisher:

DOWNLOAD EBOOK

Presented at the 2001 NCPV Program Review Meeting: First application of real-time spectroscopic ellipsometry to in situ characterization of hot-wire CVD of hydr
Real-Time Characterization of Hot-Wire CVD Growth of Si:H Films using Spectroscopic Ellipsometry: Preprint
Language: en
Pages: 0
Authors:
Categories:
Type: BOOK - Published: 2001 - Publisher:

DOWNLOAD EBOOK

Presented at the 2001 NCPV Program Review Meeting: First application of real-time spectroscopic ellipsometry to in situ characterization of hot-wire CVD of hydr
A-Si
Language: en
Pages: 2
Authors:
Categories:
Type: BOOK - Published: 2000 - Publisher:

DOWNLOAD EBOOK

We increase the deposition rate of growing hydrogenated amorphous-silicon (a-Si:H) by the hot-wire chemical vapor depositon (HWCVD) technique by adding filament
In-Situ Characterization of the Amorphous to Microcrystalline Transition in Hot Wire CVD Growth of Si
Language: en
Pages: 7
Authors:
Categories:
Type: BOOK - Published: 2002 - Publisher:

DOWNLOAD EBOOK

This conference paper provides a brief look at the current U.S. research and development (R & D) investments in photovoltaics, covering the spectrum from materi
Real-Time Spectroscopic Ellipsometry as an In-Situ Diagnostic for Hot-Wire CVD Growth of Amorphous and Epitaxial Si
Language: en
Pages: 5
Authors: T. Wang
Categories:
Type: BOOK - Published: 2005 - Publisher:

DOWNLOAD EBOOK

Real-time spectroscopic ellipsometry (RTSE) has proven to be an exceptionally valuable tool in the optimization of hot wire CVD (HWCVD) growth of both silicon h