Test And Diagnosis For Small Delay Defects
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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly
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Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increase
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The failure of devices due to timing-related defects is becoming increasingly prominent in the nanometer era, thereby causing quality and reliability concerns.
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Path selection and generating tests for small delay faults is an important issue in the delay fault area. A novel technique for generating effective vectors for