Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra

Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
Author :
Publisher : Cambridge Scholars Publishing
Total Pages : 250
Release :
ISBN-10 : 9781527543898
ISBN-13 : 1527543897
Rating : 4/5 (98 Downloads)

Book Synopsis Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra by : Anton I. Mikhailov

Download or read book Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra written by Anton I. Mikhailov and published by Cambridge Scholars Publishing. This book was released on 2019-11-25 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.


Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra Related Books

Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra
Language: en
Pages: 250
Authors: Anton I. Mikhailov
Categories: Science
Type: BOOK - Published: 2019-11-25 - Publisher: Cambridge Scholars Publishing

DOWNLOAD EBOOK

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scatterin
Publications of the National Institute of Standards and Technology ... Catalog
Language: en
Pages: 1162
Authors: National Institute of Standards and Technology (U.S.)
Categories:
Type: BOOK - Published: 1994 - Publisher:

DOWNLOAD EBOOK

Failure Analysis
Language: en
Pages: 372
Authors: Marius Bazu
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-08 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. T
Handbook of X-Ray Data
Language: en
Pages: 969
Authors: Günter H. Zschornack
Categories: Technology & Engineering
Type: BOOK - Published: 2007-01-24 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-
Analysis of Airborne Particles by Physical Methods
Language: en
Pages: 314
Authors: Malissa Hanns
Categories: Science
Type: BOOK - Published: 2018-01-18 - Publisher: CRC Press

DOWNLOAD EBOOK

First Published in 2018. Routledge is an imprint of Taylor & Francis, an Informa company.