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Atomic Force Microscopy in Process Engineering
Language: en
Pages: 300
Authors: W. Richard Bowen
Categories: Technology & Engineering
Type: BOOK - Published: 2009-06-30 - Publisher: Butterworth-Heinemann

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This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and v
Noncontact Atomic Force Microscopy
Language: en
Pages: 468
Authors: S. Morita
Categories: Mathematics
Type: BOOK - Published: 2002-07-24 - Publisher: Springer Science & Business Media

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra
Atomic Force Microscopy
Language: en
Pages: 257
Authors: Peter Eaton
Categories: Science
Type: BOOK - Published: 2010-03-25 - Publisher: Oxford University Press

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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that s
Electrical Atomic Force Microscopy for Nanoelectronics
Language: en
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Authors: Umberto Celano
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Type: BOOK - Published: 2019-08-01 - Publisher: Springer

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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated
Nanofabrication
Language: en
Pages: 583
Authors: Ampere A. Tseng
Categories: Technology & Engineering
Type: BOOK - Published: 2008 - Publisher: World Scientific

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Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at buildi