DC and RF Characterization of NiSi Schottky Barrier MOSFETs with Dopant Segregation
| Author | : Christoph Johannes Urban |
| Publisher | : Forschungszentrum Jülich |
| Total Pages | : 169 |
| Release | : 2010 |
| ISBN-10 | : 9783893366446 |
| ISBN-13 | : 389336644X |
| Rating | : 4/5 (46 Downloads) |
Book Synopsis DC and RF Characterization of NiSi Schottky Barrier MOSFETs with Dopant Segregation by : Christoph Johannes Urban
Download or read book DC and RF Characterization of NiSi Schottky Barrier MOSFETs with Dopant Segregation written by Christoph Johannes Urban and published by Forschungszentrum Jülich. This book was released on 2010 with total page 169 pages. Available in PDF, EPUB and Kindle. Book excerpt: