Defects in SiO2 and Related Dielectrics: Science and Technology
| Author | : Gianfranco Pacchioni |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 636 |
| Release | : 2000-12-31 |
| ISBN-10 | : 0792366859 |
| ISBN-13 | : 9780792366850 |
| Rating | : 4/5 (59 Downloads) |
Book Synopsis Defects in SiO2 and Related Dielectrics: Science and Technology by : Gianfranco Pacchioni
Download or read book Defects in SiO2 and Related Dielectrics: Science and Technology written by Gianfranco Pacchioni and published by Springer Science & Business Media. This book was released on 2000-12-31 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000