Download or read book Digital Noise Monitoring of Defect Origin written by Telman Aliev and published by Springer Science & Business Media. This book was released on 2007-09-20 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.