Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability

Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability
Author :
Publisher :
Total Pages : 182
Release :
ISBN-10 : OCLC:725158559
ISBN-13 :
Rating : 4/5 (59 Downloads)

Book Synopsis Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability by : Stephan Eggersglüß

Download or read book Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability written by Stephan Eggersglüß and published by . This book was released on 2010 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:


Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability Related Books

Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability
Language: en
Pages: 182
Authors: Stephan Eggersglüß
Categories:
Type: BOOK - Published: 2010 - Publisher:

DOWNLOAD EBOOK

High Quality Test Pattern Generation and Boolean Satisfiability
Language: en
Pages: 208
Authors: Stephan Eggersglüß
Categories: Technology & Engineering
Type: BOOK - Published: 2012-02-01 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisf
Test Pattern Generation using Boolean Proof Engines
Language: en
Pages: 196
Authors: Rolf Drechsler
Categories: Technology & Engineering
Type: BOOK - Published: 2009-04-22 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the
Efficient Generation of Test Patterns Using Boolean Satisfiability
Language: en
Pages: 57
Authors: Tracy Larrabee
Categories: Algebra, Boolean
Type: BOOK - Published: 1990 - Publisher:

DOWNLOAD EBOOK

Second, it applies a Boolean satisfiability algorithm to the resulting formula. This approach differs from most programs now in use, which directly search the c
Design for Testability, Debug and Reliability
Language: en
Pages: 164
Authors: Sebastian Huhn
Categories: Technology & Engineering
Type: BOOK - Published: 2021-04-19 - Publisher: Springer Nature

DOWNLOAD EBOOK

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated,