Testing Static Random Access Memories
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Language: en
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Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories
Language: en
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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects
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Pages: 252
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each
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Pages: 343
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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Y